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- NSN 4920-01-515-8913
4920-01-515-8913
Description: Electrical-electron Test Station
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Export Restrictions
Any part(s) quoted or sold by MilSpec.parts and re-sold (to a third party) CANNOT be sold to a USA embargoed country, company, entity, or person(s). Depending on the ECCN, these commodities may require export license or exception. Diversion contrary to U.S. law is prohibited. Unless otherwise noted, this sale, order or quote may include Munitions List Items (MLI) or Commerce Controlled List Items (CCLI). MLI/CCLI property is controlled by the US Government and in many cases cannot be transferred (exported, sold or given) to a foreign country, a non-US Citizen/National or a non- Permanent US Resident without a valid State/Commerce Department export authorization. It is the responsibility of (the Purchaser) to determine what the applicable requirements may be, to obtain all necessary authorizations, licenses or approvals and are subject to both review and acceptance by MilSpec.parts. The use, disposition, export and re-export of the property covered or included in this sale, order or quote is subject to the provisions of law referenced in End-Use Certificate DLA form 1822, DEC 2001, including, but not limited to, the Arms Export Control Act (22 USC 2751 et seq.); Export Administration Act of 1979 (50 USC App. 2401 et seq.) as contained under Executive Order 12924; International Traffic in Arms Regulations (22 CFR 120 et seq.); Export Administration Regulations (15 CFR 730 et seq.); Foreign Assets Control Regulations (31 CFR 500 et seq.) and the Espionage Act (18 USC 793 et seq.)
4920-01-515-8913 Properties
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NSN:4920-01-515-8913
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Description:Electrical-electron Test Station
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Shelf Life:N/A
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DEMIL:DEMIL/MLI
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UOM:1 EA
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Part Name Assigned By Controlling Agency:Test station, electrical-electronic equipment
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Special Features:Multi-frame, rack mounted set of computer controlled test instruments ainterfacface connectors. A customizable, vxi-based system utilizating system checkers; a teststudio project (tsp) enabling teststudio to execute self-tests on instruments. Provides templatesenabling test programmers to build customixed self-tests for third party instruments and provides diagnostic capabilities to maaximize reuse of existingtest program set hardware. Enables uers to develop and execute test program s for circuit baords and subsystems
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Functional Description:Used for testing b-b1 electromechanical power
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Reference Data And Literature:T.O. 33d7-38-330-1
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Relationship To Similar Equipment:Similar to s9-100-66 which are intermediate level test
